Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment that will enhance multi-disciplinary research and education ...

The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

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A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Ellipsometry Porosimetry (EP) is used to measure the thickness of the materials and how its optical properties change throughout adsorption and desorption of a volatile species either under less ...

Monitoring culture media settings is critically important across various industries to enhance cell proliferation for applications such as regenerative medicines and protein synthesis. Numerous ...